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International Journal of Advanced Research in Computer and Communication Engineering
International Journal of Advanced Research in Computer and Communication Engineering A monthly Peer-reviewed & Refereed journal
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Analysed  Modulation Doped Fieled Effect Transister (MODFET) and Metal Oxide Semiconductor Modulation Doped Fieled Effect Transister ((MOS-MODFET)) using compound material silicon Germanium (SiGe)

KAMAL PRAKASH PANDEY, RAKESH KUMAR SINGH, ANIL KUMAR Associate Professor, Deptt. of ECE, SIET, Jhalwa, Allahabad, India Assistant Professor, Deptt. of ECE, SIET, Jhalwa, Allahabad, India Assistant Professor, Deptt. of ECE, SHIATS-DU, Allahabad, India

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Abstract: In this paper SiGe material incorporated to design Modulation Doped Fieled Effect Transister (MODFET) and analysed theoretically. The SiGe is a compound semiconductor material and impurity material is P-type. The Gate length of MOS-MODFET is fabricated 0.1μm. The SiGe/Si Heterojunction grown by ultrahigh vacuum chemical vapor deposition technique. The performance of modulation-doped field effect transistor is a new approached to design FET with heterojunction field effect transistor (HBT). The performance of MOS-MODFET is also a good approached to design device as CMOS with the HBT. The characteristics shown is improved the speed and power consumption with BJT and MOSFET.

Keywords: Modulation doping , MODFET, MOS-MODFET, and Characteristics

How to Cite:

[1] KAMAL PRAKASH PANDEY, RAKESH KUMAR SINGH, ANIL KUMAR Associate Professor, Deptt. of ECE, SIET, Jhalwa, Allahabad, India Assistant Professor, Deptt. of ECE, SIET, Jhalwa, Allahabad, India Assistant Professor, Deptt. of ECE, SHIATS-DU, Allahabad, India, “Analysed  Modulation Doped Fieled Effect Transister (MODFET) and Metal Oxide Semiconductor Modulation Doped Fieled Effect Transister ((MOS-MODFET)) using compound material silicon Germanium (SiGe),” International Journal of Advanced Research in Computer and Communication Engineering (IJARCCE)

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