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International Journal of Advanced Research in Computer and Communication Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2278-1021ISSN Print 2319-5940Since 2012
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← Back to VOLUME 6, ISSUE 4, APRIL 2017

Case Study of 32nm, 22nm, 14nm and 10nm Semiconductor Process Technologies

Vishesh S, Manu Srinath, Dewarsh Diwakar Joshi, Etukala Neeruganti Sai Kaushik, Rajendra J Desai, Praveen Prasad M G

DOI: 10.17148/IJARCCE.2017.64116

Abstract: Moore�s law or Moore�s prediction is an observation that, the number of transistors in a dense integrated circuit doubles approximately every two years. [1] The period is now often quoted as 18 months by Intel executive David House. This study will examine the development and evolution of semiconductor electronics. Since semiconductors increasingly comprise a larger portion of electronic components and systems, either used directly by customers or incorporated into end use items purchased by consumers, the impact of �Moore�s law� has led users and consumers to come to expect a continuous stream of faster, better and cheaper high-technology products. This paper attempts to describe the origin, nature and implications of �Moore�s law� in a comprehensive manner. Intel�s 32nm, 22nm, 14nm and 10nm technology is examined and studied in detail. Also a retrospective approach to dealing with or coping up with Moore�s law is explained. Finally we draw limelight on how Moore�s observation transformed computing from a rare and expensive venture into a pervasive and affordable necessity. From internet, to social media and modern data analytics, which are innovations to stem directly from Moore and his findings.



Keywords: Moore�s law, semiconductor technologies, faster, better and cheaper high-technology products, Intel�s 32nm, 22nm, 14nm and 10nm technology.

How to Cite:

[1] Vishesh S, Manu Srinath, Dewarsh Diwakar Joshi, Etukala Neeruganti Sai Kaushik, Rajendra J Desai, Praveen Prasad M G, “Case Study of 32nm, 22nm, 14nm and 10nm Semiconductor Process Technologies,” International Journal of Advanced Research in Computer and Communication Engineering (IJARCCE), DOI: 10.17148/IJARCCE.2017.64116